The SURAGUS GmbH develops, manufactures and sells eddy current-based testing technology for innovative testing tasks. The company uses new technological opportunities due to advances in signal processing, the availability of more powerful computing technologies and possibilities of new manufacturing and miniaturization methods. Applications are amongst others quality control of structured and unstructured functional layers, quality assurance of carbon fiber materials and classic conductive materials. The company is a spin-off and licensees of the Fraunhofer Institute for Nondestructive Testing Dresden.

Technology

The eddy current method utilizes local conductivity variations of the test objects for the characterization of correlated quality characteristics such as thickness, conductivity, homogeneity and purity or physical changes. The complex eddy current signal contains various information about the test object which can be separated in many cases with simple or complex algorithms. Our eddy current testing technology is based on a powerful eddy current electronics with a frequency range from 10 kHz to 100 MHz, which is combined with different sensor concepts depending on the application.
Primary advantages:

• Contact-free
• Fast (EddyCus Systems measure at a rate of 50.000 measurements per second)
• Suitable for automation
• Broad porfolio of sensors for different applications

Quality Management

We develop innovative products and deliver standard and customized solutions. In order to meet the required quality demands, a process-oriented quality management system is applied. It meets the demands of the international standard DIN EN ISO 9001:2008.

Applications

• Contactless Conductivity measurement of functional thin films (e.g. TCOs, CNTs, Metallization, Silver-Nanowire)
• Non-contact Orientation testing and flaw detection for Carbon fiber composites (undulations, Impacts, gases, thrust faults)
• Contactless weight determination in many carbon fiber materials
• Determination of gradients of super-alloys
• Layer thickness measurement of thin films and coatings from 5 nm thickness
• Mapping for errors in conductive layer system (cracks, voids, delaminations, etc.)